Superior Evaporants Incorporated

Technical Information

Material: Tantalum Oxide

 

 

Formula: Ta2O5

Molecular weight: 441.9

Product Form: Grey tablets ~ 1 grams

Catalog#:  2400

 

Melting point: 1880oC

Density 8.7 g/cm3

 

Type analysis:

Iron(Fe)          < 5 ppm    Aluminum(Al)    < 5 ppm

Nickel(Ni)        < 3 ppm    Molybdenum(Mo)  < 5 ppm

Titanium(Ti)      < 3 ppm    Silicon(Si)     <13 ppm

Manganese(Mn)     < 3 ppm    Tin(Sn)         < 3 ppm

Chromium(Cr)      < 3 ppm    Niobium(Nb)     <30 ppm

Copper(Cu)        < 5 ppm    Tungsten(W)     < 5 ppm

 

Properties of thin film:

 

Transmission range: 350‑8000nm

Refractive index at 550nm ~ 2.1

 

 

Hints on evaporation:

 

Substrate temperature ~ 250oC

Deposition rate ~ 25nm/min

O2 partial pressure ~ 1 x 10‑4 mbar

 

Evaporate using E‑Beam

 

 

Applications:

 

Anti‑reflection coatings, Interference filters. Extremely hard and durable films.